Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW.
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Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW.
Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW.

Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW.

SKU: SSDM2P42000M2280FS-L
£162.00
 ETA 5 days
Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW., 2 TB, M.2, 7400 MB/s
Specifications
More Information
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Product Properties

  • Warranty
  • 3 Years
  • SKU
  • SSDM2P42000M2280FS-L
  • EAN
  • 5050914178253
  • Bullet points
  • Features
  • Hardware encryption
  • No
  • PCI Express interface data lanes
  • x4
  • Logistics data
  • Export Control Classification Number (ECCN)
  • EAR99
  • Operational conditions
  • Other features
  • Packaging data
  • Weight & dimensions

Description

Hypertec FirestormLite2TB M.2 2280 NVMe PCIe Gen 4x4 SSD; 2GB DRAM cache; 7400MB/s seq Read; 6700MB/s Seq write; Random 4K IOPS 741K read / 666k write; 1360TB TBW.. SSD capacity: 2 TB, SSD form factor: M.2, Read speed: 7400 MB/s, Write speed: 6700 MB/s, Component for: Universal
  • 2 TB M.2 PCI Express 4.0
  • Read speed: 7400 MB/s 741 IOPS
  • Write speed: 6700 MB/s 666 IOPS
  • 3D TLC NVMe
  • S.M.A.R.T. support TRIM support
  • Component for: Universal
  • Free Lifetime Technical Support
  • Matched options available Suitable for both client SSDs as well as NAND-cache drives
  • Noise and vibration-free for completely silent computing
  • Zero moving parts prevent mechanical malfunctions and extend product life
  • S.M.A.R.T self-monitoring attributes improve reliability
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